An new approach to reliable FSRs lDesign

Since the invention of integrated circuits in 1950s, the great budget of reliability of semiconductors have prompted the 60 years of glory of electrical industry. However, as the technology shrinks in recent years, the continuing rising of circuit density and the reduction of device sizes cause a lot of new constrains and problems, such as high power consumption and leakage currents in nano-meter designs. One of the serious consequences of these changes is the reduction of circuit reliability. In this paper, we introduce a new method for correcting transient faults in Feedback Shift Registers (FSRs) based on duplication and parity checking. The presented method is more reliable than Triple Model Redundancy (TMR) for large FSRs, while the area overhead of the two approaches is comparable. The presented approach might be important for applications using large FSRs, e.g. cryptography.