DocumentCode
1792606
Title
Cu/Cu direct bonding by metal salt generation bonding technique with organic acid and its persistence of reformed layer
Author
Koyama, Shinji ; Hagiwara, Naoki ; Shohji, Ikuo
Author_Institution
Grad. Sch. of Sci. & Technol., Gunma Univ., Kiryu, Japan
fYear
2014
fDate
15-16 July 2014
Firstpage
40
Lastpage
40
Abstract
In this study, the effect of metal salt generation bonding method on the bonded strength of the solid-state direct bonded interface of copper was investigated. The specimen to be bonded was a block 15 mm × 15 mm × 5 mm cut from 99.9% ingot and a wire (99.9% purity) dimension of φ 1.2 mm. Copper surfaces were modified by boiling in several types of organic acid for predetermined time. Solid-state bonding was performed in a vacuum chamber at bonding temperature of 423-673 K under a pressure of 588 N (bonding time of 0.9 ks). As a result of metal salt generation bonding method, bonded joints were obtained at a bonding temperature 150 K (formic acid) and 100 K (citric acid) lower than that required for non-modified surfaces, and the bond strength was comparable to that of the maximum load. In addition, the durability of the modification effect was investigated by leaving the modified surface to an air atmosphere furnace which kept at 323 K. After the shelf test, solid-state bonding was performed. As a result of peel test, with increase of the shelf time, bond strength was not decreased even for 168 hours when it modified with citric acid, but bond strength decreased in several hours when it modified with formic acid.
Keywords
copper; organic compounds; surface treatment; three-dimensional integrated circuits; wafer bonding; Cu; Cu-Cu direct bonding; bond strength; citric acid; formic acid; metal salt generation bonding technique; organic acid; shelf test; solid-state direct bonded copper interface; surface modification; temperature 423 K to 673 K; Bonding; Copper; Films; Joints; Plasma temperature; Surface cracks;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Temperature Bonding for 3D Integration (LTB-3D), 2014 4th IEEE International Workshop on
Conference_Location
Tokyo
Print_ISBN
978-1-4799-5260-1
Type
conf
DOI
10.1109/LTB-3D.2014.6886179
Filename
6886179
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