New scanning probe microscopy near-field imaging method for laser radiation intensity mapping

Author

Alekseev, P.A. ; Dunaevskiy, M.S. ; Monahov, A.M. ; Titkov, A.N. ; Baranov, A.N. ; Girard, P. ; Teissier, R.

Author_Institution

Ioffe Inst., St. Petersburg, Russia

fYear

2014

fDate

June 30 2014-July 4 2014

Firstpage

1

Lastpage

1

Abstract

Novel scanning probe microscopy method of near field imaging of laser radiation is proposed. The method providing a submicron spatial resolution is based on detection of a shift of the probe resonance related to its heating by absorbed radiation. The method has been realized with a conventional silicon probe and has been employed for visualization of infrared emission from a half-disk semiconductor whispering gallery mode laser.

Keywords

laser modes; measurement by laser beam; scanning probe microscopy; semiconductor lasers; whispering gallery modes; absorbed radiation heating; half-disk semiconductor whispering gallery mode laser; infrared emission; laser radiation intensity mapping; near-field imaging method; probe resonance; scanning probe microscopy; silicon probe; submicron spatial resolution; Gain measurement; Laser modes; Measurement by laser beam; Visualization; laser radiation; near field; scanning probe microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Laser Optics, 2014 International Conference

Conference_Location

Saint Petersburg

Print_ISBN

978-1-4799-3884-1

Type

conf

DOI

10.1109/LO.2014.6886366

Filename

6886366