Title :
Application of modern method of calculating uncertainty to microwaves and opto-electronics
Author :
Pavlyuchenko, Ekaterina ; Salzenstein, Patrice
Author_Institution :
Opt. Dept., FEMTO-ST, Besancon, France
fDate :
June 30 2014-July 4 2014
Abstract :
Summary form only given: Recent approach is used to calculate uncertainty for an microwave and optoelectronic system. The deduced global uncertainty on spectral density of phase noise in the range of 2 dB is improved.
Keywords :
microwave photonics; optical noise; phase noise; gain 2 dB; microwave system; optoelectronic system; phase noise; spectral density; uncertainty calculation; Measurement uncertainty; Noise measurement; Optical resonators; Phase measurement; Phase noise; Uncertainty; microwaves; opto-electronics; uncertainty;
Conference_Titel :
Laser Optics, 2014 International Conference
Conference_Location :
Saint Petersburg
Print_ISBN :
978-1-4799-3884-1
DOI :
10.1109/LO.2014.6886449
