Title :
Collaborative detection of common lines in cryo EM images using maximum likelihood
Author :
Cohen, Moshik ; Shkolnisky, Yoel ; Yeredor, Arie
Author_Institution :
Sch. of Electr. Eng., Tel-Aviv Univ., Tel-Aviv, Israel
Abstract :
This paper presents a maximum likelihood (ML) algorithm for detecting (shared) common lines between pairs of cryo-EM projection images. The algorithm is based on a global iterative detector in which we jointly estimate and classify common lines using the data from all projection images. We demonstrate by simulations that the algorithm improves the detection rate of common lines compared to state of the art methods, and operates well even with non white imaging noise.
Keywords :
computerised instrumentation; edge detection; iterative methods; maximum likelihood detection; transmission electron microscopy; collaborative common lines detection; cryo-EM projection images; global iterative detector; maximum likelihood algorithm;
Conference_Titel :
Electrical & Electronics Engineers in Israel (IEEEI), 2014 IEEE 28th Convention of
Conference_Location :
Eilat
Print_ISBN :
978-1-4799-5987-7
DOI :
10.1109/EEEI.2014.7005782