• DocumentCode
    1793408
  • Title

    Reliability of VCSELs for >25Gb/s

  • Author

    Guenter, James ; Hawkins, Bobby ; Hawthorne, Robert ; Landry, Gary

  • Author_Institution
    Finisar Corp., Allen, TX, USA
  • fYear
    2014
  • fDate
    9-13 March 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The next individual-channel VCSEL (Vertical Cavity Surface Emitting Laser) node for data communications is 25 Gbps or higher. Providing the required reliability becomes ever more challenging as the speeds increase, but possible with proper design.
  • Keywords
    data communication; semiconductor device reliability; surface emitting lasers; VCSEL node; VCSEL reliability; data communications; vertical cavity surface emitting laser node; Acceleration; Data communication; Reliability engineering; Stress; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Fiber Communications Conference and Exhibition (OFC), 2014
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-5575-2994-7
  • Type

    conf

  • DOI
    10.1364/OFC.2014.M3G.2
  • Filename
    6886609
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1793408