DocumentCode
1795713
Title
10 GHz bandwidth of Si avalanche photodiode fabricated by standard 0.18 цm CMOS process
Author
Iiyama, Koichi ; Shimotori, Toshiyuki ; Gyobu, Ryoichi ; Hishiki, Takuya ; Marayama, Takeo
Author_Institution
Kanazawa Univ., Kanazawa, Japan
fYear
2014
fDate
6-10 July 2014
Firstpage
243
Lastpage
244
Abstract
Silicon avalanche photodiode was fabricated by O.lSjum CMOS process and was characterized. The bandwidth of 10GHz with the sensitivity of 0.1 AW was achieved with the electrode spacing of 0.84/urn and the detection area of 10×10/urn2.
Keywords
CMOS integrated circuits; avalanche photodiodes; electrodes; elemental semiconductors; silicon; CMOS process; Si; avalanche photodiode; bandwidth 10 GHz; detection area; electrode spacing; sensitivity; size 0.18 mum; Avalanche photodiodes; Bandwidth; CMOS process; Electrodes; Radio frequency; Silicon; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Fibre Technology, 2014 OptoElectronics and Communication Conference and Australian Conference on
Conference_Location
Melbourne, VIC
Type
conf
Filename
6888063
Link To Document