• DocumentCode
    1796485
  • Title

    Error value driven fault analysis attack

  • Author

    Yoshikawa, Masatoshi ; Goto, Hiromi ; Asahi, Koichiro

  • Author_Institution
    Dept. of Inf. Eng., Meijo Univ., Nagoya, Japan
  • fYear
    2014
  • fDate
    June 30 2014-July 2 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The advanced encryption standard (AES) has been sufficiently studied to confirm that its decryption is computationally impossible. However, its vulnerability against fault analysis attacks has been pointed out in recent years. To verify the vulnerability of electronic devices in the future, into which cryptographic circuits have been incorporated, fault Analysis attacks must be thoroughly studied. The present study proposes a new fault analysis attack method which utilizes the tendency of an operation error due to a glitch. The present study also verifies the validity of the proposed method by performing evaluation experiments using FPGA.
  • Keywords
    cryptography; field programmable gate arrays; AES; advanced encryption standard; cryptographic circuits; error value driven fault analysis attack method; Ciphers; Circuit faults; Encryption; Equations; Field programmable gate arrays; Standards; Error value; Fault analysis attacks; Side-channel attack; Tamper resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD), 2014 15th IEEE/ACIS International Conference on
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/SNPD.2014.6888689
  • Filename
    6888689