DocumentCode
1796485
Title
Error value driven fault analysis attack
Author
Yoshikawa, Masatoshi ; Goto, Hiromi ; Asahi, Koichiro
Author_Institution
Dept. of Inf. Eng., Meijo Univ., Nagoya, Japan
fYear
2014
fDate
June 30 2014-July 2 2014
Firstpage
1
Lastpage
4
Abstract
The advanced encryption standard (AES) has been sufficiently studied to confirm that its decryption is computationally impossible. However, its vulnerability against fault analysis attacks has been pointed out in recent years. To verify the vulnerability of electronic devices in the future, into which cryptographic circuits have been incorporated, fault Analysis attacks must be thoroughly studied. The present study proposes a new fault analysis attack method which utilizes the tendency of an operation error due to a glitch. The present study also verifies the validity of the proposed method by performing evaluation experiments using FPGA.
Keywords
cryptography; field programmable gate arrays; AES; advanced encryption standard; cryptographic circuits; error value driven fault analysis attack method; Ciphers; Circuit faults; Encryption; Equations; Field programmable gate arrays; Standards; Error value; Fault analysis attacks; Side-channel attack; Tamper resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD), 2014 15th IEEE/ACIS International Conference on
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/SNPD.2014.6888689
Filename
6888689
Link To Document