DocumentCode :
1796552
Title :
The analysis method focusing on peaks of darkness for the impression evaluation method by space
Author :
Akai, Shunsuke ; Hochin, Teruhisa ; Nomiya, Hiroki
Author_Institution :
Grad. Sch. of Inf. Sci., Kyoto Inst. of Technol., Kyoto, Japan
fYear :
2014
fDate :
June 30 2014-July 2 2014
Firstpage :
1
Lastpage :
6
Abstract :
This paper proposes an analysis method of the evaluation results obtained through the Impression Evaluation Method by Space (IEMS). The IEMS uses a plane containing impression words as the Kansei space. The impression of an object is specified by circling the areas matching the impression. The degree of matching the impression is expressed by painting color. As the impression words can be moved and/or added in the IEMS, it is difficult to analyze the evaluation results obtained from many subjects. The proposed analysis method focuses on the peaks of darkness. It is called the analysis method focusing on the peaks of darkness (abbr. AM_PD). By mapping the peaks of the darkness in each evaluation result to the same Kansei space, this method can analyze characteristic impressions. In this paper, the algorithm of extracting obvious peaks automatically is proposed toward realization of the AM_PD. The parameters of the AM_PD required to extract the obvious peaks are experimentally determined. This paper shows that the obvious peaks in the evaluation results can be extracted by using this algorithm.
Keywords :
image colour analysis; AM_PD; IEMS; Kansei space; characteristic impression analysis; color darkness; darkness peaks; impression evaluation method by space; impression words; object impression; painting color; Algorithm design and analysis; Color; Dispersion; Educational institutions; Focusing; Image color analysis; Painting; Analysis method; Kansei; impression evaluation; impression space; vagueness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD), 2014 15th IEEE/ACIS International Conference on
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/SNPD.2014.6888721
Filename :
6888721
Link To Document :
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