DocumentCode :
1796934
Title :
A 0.43pJ/bit true random number generator
Author :
Ting-Kuei Kuan ; Yu-Hsuan Chiang ; Shen-Iuan Liu
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2014
fDate :
10-12 Nov. 2014
Firstpage :
33
Lastpage :
36
Abstract :
A small-area energy-efficient true random number generator (TRNG) is presented. This TRNG introduces a jitter signal generator to realize the noise pre-amplification, and utilizes a metastable latch to resolve the jitter edges. Moreover, to tolerate the process and environment variations, an offset calibration is employed to dynamically correct the bias of the probability of logic 0/1 in background. A prototype is fabricated in 40-nm CMOS technology. It occupies an area of 0.0014mm2 and consumes 214nW from a 0.8-V supply at a throughput of 500kbps. The proposed TRNG passes the NIST tests, and its calculated FOM is 0.43pJ/bit.
Keywords :
CMOS logic circuits; calibration; jitter; random number generation; signal generators; CMOS technology; NIST tests; TRNG; bit rate 500 kbit/s; environment variations; jitter signal generator; logic probability; noise pre-amplification; offset calibration; power 214 nW; size 40 nm; small-area energy-efficient true random number generator; voltage 0.8 V; Calibration; Generators; Jitter; Latches; NIST; Noise; Signal generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference (A-SSCC), 2014 IEEE Asian
Conference_Location :
KaoHsiung
Print_ISBN :
978-1-4799-4090-5
Type :
conf
DOI :
10.1109/ASSCC.2014.7008853
Filename :
7008853
Link To Document :
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