DocumentCode :
1797669
Title :
Confidence factor and feature selection for semi-supervised multi-label classification methods
Author :
Rodrigues, Fillipe M. ; Camara, Campus Joao ; Canuto, Anne M. P. ; Santos, Araken M.
Author_Institution :
Fed. Inst. of Rio Grande do Norte (IFRN), Rio Grande, Brazil
fYear :
2014
fDate :
6-11 July 2014
Firstpage :
864
Lastpage :
871
Abstract :
In this paper, we investigate two important problems in multi-label classification algorithms, which are: the number of labeled instances and the high dimensionality of the labeled instances. In the literature, we can find several papers about multi-label classification problems, where an instance can be associated with more than one label simultaneously. One of the main issues with multi-label classification methods is that many of these require a high number of instances to be able to generalize in an efficient way. In order to solve this problem, we used semi-supervised learning, which combines labeled and unlabeled instances during the training process. In this sense, the semi-supervised learning may become an essential tool to define, efficiently, the process of automatic assignment of labels. Therefore, this paper presents four semi-supervised methods for the multi-label classification, focusing on the use of a confidence parameter in the process of automatic assignment of labels. In order to validate the feasibility of these methods, an empirical analysis will be conducted using high-dimensional datasets, aiming to evaluate the performance of such methods in different situations. In this case, we will apply a feature selection algorithm in order to reduce, in an efficient way, the number of features to be used by the classification methods.
Keywords :
feature selection; learning (artificial intelligence); pattern classification; automatic label assignment; confidence factor; confidence parameter; empirical analysis; feature selection; high-dimensional datasets; high-dimensional labeled instances; performance evaluation; semisupervised learning; semisupervised multilabel classification methods; training process; unlabeled instances; Accuracy; Classification algorithms; Labeling; Measurement; Semisupervised learning; Standards; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks (IJCNN), 2014 International Joint Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-6627-1
Type :
conf
DOI :
10.1109/IJCNN.2014.6889564
Filename :
6889564
Link To Document :
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