• DocumentCode
    1797910
  • Title

    On optimal wavelet bases for classification of skin lesion images through ensemble learning

  • Author

    Surowka, Grzegorz ; Ogorzalek, Maciej

  • Author_Institution
    Fac. of Phys., Astron. & Appl. Comput. Sci., Jagiellonian Univ., Kraków, Poland
  • fYear
    2014
  • fDate
    6-11 July 2014
  • Firstpage
    165
  • Lastpage
    170
  • Abstract
    In order to recognize early symptoms of melanoma, the fatal cancer of the skin, systems for computer aided melanoma diagnosis have been developed for years. In this work we analyze an ensemble-based binary classifier for discriminating melanoma from dysplastic nevus utilizing wavelet-based features of the dermatoscopic skin lesion images. The multiresolution decomposition of the dermatoscopy images is done through wavelet packets. We search for the optimal wavelet base maximizing the quality of the classifier in terms of AUC (Area Under Curve) for models optimized by some common quality measures: accuracy, precision, Fl-score, FP-rate, specificity, BER and recall. Within the statistics of our experiments reverse bi-orthogonal wavelet rbio 3.1 makes the best wavelet model of melanoma.
  • Keywords
    cancer; feature extraction; image classification; learning (artificial intelligence); medical image processing; skin; wavelet transforms; AUC; BER measure; FP-rate; Fl-score; accuracy measure; area under curve; computer aided melanoma diagnosis; dermatoscopic skin lesion images; dermatoscopy image decomposition; dysplastic nevus; ensemble learning; ensemble-based binary classifier; melanoma symptoms; optimal wavelet base; precision measure; recall measure; reverse bi-orthogonal wavelet; skin cancer; skin lesion image classification; specificity measure; wavelet packets; wavelet-based features; Data models; Malignant tumors; Skin; Training; Wavelet analysis; Wavelet packets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks (IJCNN), 2014 International Joint Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-6627-1
  • Type

    conf

  • DOI
    10.1109/IJCNN.2014.6889680
  • Filename
    6889680