DocumentCode :
1798291
Title :
Improvement of power integrity with thin film capacitors embedded in organic interposer
Author :
Yoshizawa, Masamitsu ; Oyamada, Seisei ; Hattori, Asobu ; Nakura, Toru ; Asada, Kunihiro
Author_Institution :
Noda Screen Co., Ltd., Komaki, Japan
fYear :
2014
fDate :
4-6 Nov. 2014
Firstpage :
122
Lastpage :
125
Abstract :
In this paper, we demonstrate our STO thin film decoupling capacitor embedded in organic interposer is effective for reduction of resonant power supply noise of LSI. By comparison of Shmoo plots with on-chip MOS capacitor, significant contributions of STO capacitor to higher operable frequency and lower power supply voltage are shown.
Keywords :
large scale integration; thin film capacitors; LSI; Shmoo plots; on-chip MOS capacitor; organic interposer; power integrity; resonant power supply noise reduction; thin film capacitors; Capacitance; Capacitors; Large scale integration; MOS capacitors; Noise; Power supplies; System-on-chip; embedded capacitor; interposer; power integrity; power supply noise; thin film capacitor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
CPMT Symposium Japan (ICSJ), 2014 IEEE
Conference_Location :
Kyoto
Print_ISBN :
978-1-4799-6194-8
Type :
conf
DOI :
10.1109/ICSJ.2014.7009625
Filename :
7009625
Link To Document :
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