• DocumentCode
    1798315
  • Title

    High-speed optical beam scanning using KTN crystal

  • Author

    Sakamoto, Takanori ; Toyoda, Seiji ; Ueno, Masahiro ; Kobayashi, Junya

  • Author_Institution
    NTT Device Innovation Center, Nippon Telegraph & Telephone Corp., Atsugi, Japan
  • fYear
    2014
  • fDate
    4-6 Nov. 2014
  • Firstpage
    173
  • Lastpage
    176
  • Abstract
    500 kHz optical beam scanning with a full scan angle of over 100 mrad is demonstrated using a potassium tantalite niobate (KTa1-xNbxO3, KTN) deflector. To suppress any heating of the KTN chips during the high frequency operation and to have a sufficient interaction length to achieve more than 100 mrad deflection, the deflector consists of two KTN chips each of which has a pentagon-shaped electrode surface whose longest side is shortened to 1.5 mm. The full scan angle of the deflector is measured and the KTN temperature dependence of the permittivity accounts for the voltage and frequency dependence of the scan angle.
  • Keywords
    electro-optical deflectors; permittivity; potassium compounds; tantalum compounds; thermoelectricity; KTN crystal; KTaNbO3; deflector; frequency 500 kHz; high frequency operation; high-speed optical beam scanning; pentagon-shaped electrode surface; potassium tantalite niobate; scan angle; size 1.5 mm; temperature dependent-permittivity; Crystals; Electrodes; Electrooptic deflectors; Heating; Optical beams; Permittivity; Temperature measurement; Kerr effect; deflector; electrooptic effect; space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    CPMT Symposium Japan (ICSJ), 2014 IEEE
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4799-6194-8
  • Type

    conf

  • DOI
    10.1109/ICSJ.2014.7009638
  • Filename
    7009638