DocumentCode :
1798315
Title :
High-speed optical beam scanning using KTN crystal
Author :
Sakamoto, Takanori ; Toyoda, Seiji ; Ueno, Masahiro ; Kobayashi, Junya
Author_Institution :
NTT Device Innovation Center, Nippon Telegraph & Telephone Corp., Atsugi, Japan
fYear :
2014
fDate :
4-6 Nov. 2014
Firstpage :
173
Lastpage :
176
Abstract :
500 kHz optical beam scanning with a full scan angle of over 100 mrad is demonstrated using a potassium tantalite niobate (KTa1-xNbxO3, KTN) deflector. To suppress any heating of the KTN chips during the high frequency operation and to have a sufficient interaction length to achieve more than 100 mrad deflection, the deflector consists of two KTN chips each of which has a pentagon-shaped electrode surface whose longest side is shortened to 1.5 mm. The full scan angle of the deflector is measured and the KTN temperature dependence of the permittivity accounts for the voltage and frequency dependence of the scan angle.
Keywords :
electro-optical deflectors; permittivity; potassium compounds; tantalum compounds; thermoelectricity; KTN crystal; KTaNbO3; deflector; frequency 500 kHz; high frequency operation; high-speed optical beam scanning; pentagon-shaped electrode surface; potassium tantalite niobate; scan angle; size 1.5 mm; temperature dependent-permittivity; Crystals; Electrodes; Electrooptic deflectors; Heating; Optical beams; Permittivity; Temperature measurement; Kerr effect; deflector; electrooptic effect; space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
CPMT Symposium Japan (ICSJ), 2014 IEEE
Conference_Location :
Kyoto
Print_ISBN :
978-1-4799-6194-8
Type :
conf
DOI :
10.1109/ICSJ.2014.7009638
Filename :
7009638
Link To Document :
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