DocumentCode
1798315
Title
High-speed optical beam scanning using KTN crystal
Author
Sakamoto, Takanori ; Toyoda, Seiji ; Ueno, Masahiro ; Kobayashi, Junya
Author_Institution
NTT Device Innovation Center, Nippon Telegraph & Telephone Corp., Atsugi, Japan
fYear
2014
fDate
4-6 Nov. 2014
Firstpage
173
Lastpage
176
Abstract
500 kHz optical beam scanning with a full scan angle of over 100 mrad is demonstrated using a potassium tantalite niobate (KTa1-xNbxO3, KTN) deflector. To suppress any heating of the KTN chips during the high frequency operation and to have a sufficient interaction length to achieve more than 100 mrad deflection, the deflector consists of two KTN chips each of which has a pentagon-shaped electrode surface whose longest side is shortened to 1.5 mm. The full scan angle of the deflector is measured and the KTN temperature dependence of the permittivity accounts for the voltage and frequency dependence of the scan angle.
Keywords
electro-optical deflectors; permittivity; potassium compounds; tantalum compounds; thermoelectricity; KTN crystal; KTaNbO3; deflector; frequency 500 kHz; high frequency operation; high-speed optical beam scanning; pentagon-shaped electrode surface; potassium tantalite niobate; scan angle; size 1.5 mm; temperature dependent-permittivity; Crystals; Electrodes; Electrooptic deflectors; Heating; Optical beams; Permittivity; Temperature measurement; Kerr effect; deflector; electrooptic effect; space charge;
fLanguage
English
Publisher
ieee
Conference_Titel
CPMT Symposium Japan (ICSJ), 2014 IEEE
Conference_Location
Kyoto
Print_ISBN
978-1-4799-6194-8
Type
conf
DOI
10.1109/ICSJ.2014.7009638
Filename
7009638
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