Optical quality control of Gas Electron Multiplier foils

Author

Rodriguez, S. Cesar A. ; Gutierrez, S. Rafael M. ; Jaramillo, V. Andres E.

Author_Institution

Complex Syst. Res. Group, Antonio Narino Univ., Bogota, Colombia

fYear

2014

fDate

17-19 Sept. 2014

Firstpage

1

Lastpage

5

Abstract

The Gas Electron Multiplier (GEM) is one of the most popular and powerful technologies for gaseous ionization detectors used in high energy physics, medical physics and other applications. One of the fundamental elements of a GEM is foils with micro perforations; the qualities of such perforations are basic for an optimal performance of the GEM. In this work we study different computational methods (implemented in java programming language), in order to determine the quality of GEM-foils from high resolution images of the foils. This computational method will provide an automatic and high precision alternative to a procedure which, at the moment, is very expensive, slow and imprecise, being a limitation for the development and application of this important technology of detectors.

Keywords

electron multipliers; high energy physics instrumentation computing; GEM-foils; computational methods; gas electron multiplier foils; high energy physics; medical physics; microperforations; optical quality control; Convolution; Detectors; Electron multipliers; Image resolution; Kernel; Mathematical model; Transforms;

fLanguage

English

Publisher

ieee

Conference_Titel

Image, Signal Processing and Artificial Vision (STSIVA), 2014 XIX Symposium on

Conference_Location

Armenia

Type

conf

DOI

10.1109/STSIVA.2014.7010155

Filename

7010155