DocumentCode
1800211
Title
A Generic Framework for Scan Capture Power Reduction in Test Compression Environment
Author
Liu, Xiao ; Yuan, Feng ; Xu, Qiang
Author_Institution
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin
fYear
2008
fDate
28-30 Oct. 2008
Firstpage
1
Lastpage
1
Abstract
This work proposes a generic framework for reducing scan capture power in test compression environment. Using the entropy of the test set to measure the impact of capture power-aware X-filling on the potential test compression ratio, the proposed method is able to keep capture power under a safe limit with little loss in test compression ratio.
Keywords
integrated circuit testing; power consumption; generic framework; integrated circuits testing; potential test compression ratio; power-aware X-filling; scan capture power reduction; test compression environment; Circuit testing; Computer science; Entropy; Flowcharts; Hamming distance; Integrated circuit testing; Power engineering and energy; Power engineering computing; Probability; Reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700699
Filename
4700699
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