DocumentCode
1800235
Title
High Test Quality in Low Pin Count Applications
Author
Souza, Jayant D. ; Mahadevan, Subramanian ; Mukherjee, Nilanjan ; Rhodes, Graham ; Moreau, Jocelyn ; Droniou, Thomas ; Armagnat, Paul ; Sartoretti, Damien
Author_Institution
Mentor Graphics Corp., Wilsonville, OR
fYear
2008
fDate
28-30 Oct. 2008
Firstpage
1
Lastpage
1
Abstract
We will show the real implementation of a very high test compression scheme for a 3 pin image sensor device. This new approach results in achieving the same compression ratio of 27.7X and the same test coverage on 3 pins instead of 8 pins for a typical scan design.
Keywords
circuit testing; image sensors; 3 pin image sensor device; high test quality; low pin count applications; very high test compression; Automatic test pattern generation; Clocks; Graphics; Image coding; Image sensors; Logic; Microelectronics; Pins; Test pattern generators; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700700
Filename
4700700
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