Title :
High Test Quality in Low Pin Count Applications
Author :
Souza, Jayant D. ; Mahadevan, Subramanian ; Mukherjee, Nilanjan ; Rhodes, Graham ; Moreau, Jocelyn ; Droniou, Thomas ; Armagnat, Paul ; Sartoretti, Damien
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR
Abstract :
We will show the real implementation of a very high test compression scheme for a 3 pin image sensor device. This new approach results in achieving the same compression ratio of 27.7X and the same test coverage on 3 pins instead of 8 pins for a typical scan design.
Keywords :
circuit testing; image sensors; 3 pin image sensor device; high test quality; low pin count applications; very high test compression; Automatic test pattern generation; Clocks; Graphics; Image coding; Image sensors; Logic; Microelectronics; Pins; Test pattern generators; Testing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700700
