Title :
Test Quality Improvement with Timing-aware ATPG: Screening small delay defect case study
Author :
Chang, C.-J.J. ; Kobayashi, Takeo
Author_Institution :
DTV Div., AMD, Markham, ON
Abstract :
Silicon results from 512 K sample chips tested with Timing-aware ATPG are presented. We had 4040 unique detections from 86 K timing-aware pattern. We will also show ATPG results and estimate the quality impact of timing-aware ATPG.
Keywords :
automatic test pattern generation; ATPG; small delay defect; test quality improvement; timing aware; Application specific integrated circuits; Automatic test pattern generation; Delay; Failure analysis; Pattern analysis; Production; Silicon; Surface-mount technology; Testing; Timing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700702
