• DocumentCode
    1800350
  • Title

    Overview of a High Speed Top Side Socket Solution

  • Author

    Stewart, John ; Animashaun, Temitope

  • Author_Institution
    Intel Corp., Hillsboro, OR
  • fYear
    2008
  • fDate
    28-30 Oct. 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    A topside contactor design is described. Measured results are provided demonstrating successful operation of the topside contactor solution.
  • Keywords
    automatic test equipment; contactors; high-speed integrated circuits; integrated circuit design; integrated circuit testing; IC package; high speed top side socket; intersymbol interference; synchronous ATE tester interface; topside contactor design; Attenuation; Connectors; Contacts; Delay; Integrated circuit packaging; Intersymbol interference; Pins; Product development; Sockets; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700705
  • Filename
    4700705
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1800350