• DocumentCode
    1800686
  • Title

    Reconfigurable virtual test system on performance of circuit

  • Author

    Xu, Licheng ; Zhang, Yu ; Wang, Zhaoqing ; Tie, Zhixin

  • Author_Institution
    Dept. of Comput. Sci., Zhejiang Sci-Tech Univ., Hangzhou, China
  • Volume
    3
  • fYear
    2011
  • fDate
    24-26 Dec. 2011
  • Firstpage
    1473
  • Lastpage
    1476
  • Abstract
    This document presents and demonstrates the design of a reconfigurable system in the low-power circuit testing, based on the data acquisition platform which useing virtual instrument technology. The circuit performance automatic testing system has been developed which is reliable,stable and powerful. The use of virtual instrument technique enables test engineers to shorten the development cycle, and development efficiency has been greatly improved. Meanwhile, the design of reconfigurable strategy, makes test engineers very easy to test the circuit according to their own custom testing programs, and makes the system meets the different circuit performance testing, and reduces test engineer´s duplication of work, significantly improves the efficiency of the test.
  • Keywords
    data acquisition; electronic engineering computing; integrated circuit design; integrated circuit testing; reconfigurable architectures; virtual instrumentation; circuit performance; circuit performance automatic testing system; custom testing programs; data acquisition platform; development cycle; development efficiency; low-power circuit testing; reconfigurable virtual test system; virtual instrument technology; Instruments; Manuals; Universal Serial Bus; Volume measurement; circuit test; data acquisition; strategy; virtual instrument;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Network Technology (ICCSNT), 2011 International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4577-1586-0
  • Type

    conf

  • DOI
    10.1109/ICCSNT.2011.6182244
  • Filename
    6182244