• DocumentCode
    1800762
  • Title

    A proven qualification methodology for embedded CMOS memory compilers

  • Author

    Capraro, Remi ; Ammar, Lotfi Ben

  • Author_Institution
    ATMEL Rousset, Rousset
  • fYear
    2008
  • fDate
    25-27 March 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    CMOS memory compilers become more and more the standard offer to fit customer needs for embedded applications. In order to select, verify, characterize and qualify such CMOS memory compilers, we have developed a complete and generic methodology. First step consists of the evaluation and the selection of the most relevant compilers. Then, we proceed to pre- silicon verifications and post-silicon characterization tests. Silicon characterization is a key step in the proposed methodology and is based on fabrication and test of a representative vehicle. Our approach has been proven on silicon for several technology nodes and process options, with different memory compiler providers. Some silicon results of our 130 nm memory compilers are shown in this paper.
  • Keywords
    CMOS memory circuits; circuit testing; CMOS; memory compilers; testchip design; CMOS technology; Costs; Fabrication; Performance evaluation; Qualifications; Silicon; System-on-a-chip; Testing; Time to market; Vehicles; CMOS memory compilers; silicon characterization; test patterns; testchip design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology of Integrated Systems in Nanoscale Era, 2008. DTIS 2008. 3rd International Conference on
  • Conference_Location
    Tozeur
  • Print_ISBN
    978-1-4244-1576-2
  • Electronic_ISBN
    978-1-4244-1577-9
  • Type

    conf

  • DOI
    10.1109/DTIS.2008.4540241
  • Filename
    4540241