DocumentCode :
1800762
Title :
A proven qualification methodology for embedded CMOS memory compilers
Author :
Capraro, Remi ; Ammar, Lotfi Ben
Author_Institution :
ATMEL Rousset, Rousset
fYear :
2008
fDate :
25-27 March 2008
Firstpage :
1
Lastpage :
6
Abstract :
CMOS memory compilers become more and more the standard offer to fit customer needs for embedded applications. In order to select, verify, characterize and qualify such CMOS memory compilers, we have developed a complete and generic methodology. First step consists of the evaluation and the selection of the most relevant compilers. Then, we proceed to pre- silicon verifications and post-silicon characterization tests. Silicon characterization is a key step in the proposed methodology and is based on fabrication and test of a representative vehicle. Our approach has been proven on silicon for several technology nodes and process options, with different memory compiler providers. Some silicon results of our 130 nm memory compilers are shown in this paper.
Keywords :
CMOS memory circuits; circuit testing; CMOS; memory compilers; testchip design; CMOS technology; Costs; Fabrication; Performance evaluation; Qualifications; Silicon; System-on-a-chip; Testing; Time to market; Vehicles; CMOS memory compilers; silicon characterization; test patterns; testchip design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Technology of Integrated Systems in Nanoscale Era, 2008. DTIS 2008. 3rd International Conference on
Conference_Location :
Tozeur
Print_ISBN :
978-1-4244-1576-2
Electronic_ISBN :
978-1-4244-1577-9
Type :
conf
DOI :
10.1109/DTIS.2008.4540241
Filename :
4540241
Link To Document :
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