DocumentCode
1800762
Title
A proven qualification methodology for embedded CMOS memory compilers
Author
Capraro, Remi ; Ammar, Lotfi Ben
Author_Institution
ATMEL Rousset, Rousset
fYear
2008
fDate
25-27 March 2008
Firstpage
1
Lastpage
6
Abstract
CMOS memory compilers become more and more the standard offer to fit customer needs for embedded applications. In order to select, verify, characterize and qualify such CMOS memory compilers, we have developed a complete and generic methodology. First step consists of the evaluation and the selection of the most relevant compilers. Then, we proceed to pre- silicon verifications and post-silicon characterization tests. Silicon characterization is a key step in the proposed methodology and is based on fabrication and test of a representative vehicle. Our approach has been proven on silicon for several technology nodes and process options, with different memory compiler providers. Some silicon results of our 130 nm memory compilers are shown in this paper.
Keywords
CMOS memory circuits; circuit testing; CMOS; memory compilers; testchip design; CMOS technology; Costs; Fabrication; Performance evaluation; Qualifications; Silicon; System-on-a-chip; Testing; Time to market; Vehicles; CMOS memory compilers; silicon characterization; test patterns; testchip design;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Technology of Integrated Systems in Nanoscale Era, 2008. DTIS 2008. 3rd International Conference on
Conference_Location
Tozeur
Print_ISBN
978-1-4244-1576-2
Electronic_ISBN
978-1-4244-1577-9
Type
conf
DOI
10.1109/DTIS.2008.4540241
Filename
4540241
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