Title :
On-line CMOS BICS: an experimental study
Author :
Maidon, Y. ; Deval, Y. ; Temas, J. ; Verdier, F. ; Begueret, J.B. ; Dom, J.P.
Author_Institution :
Lab. IXL, Bordeaux I Univ., Talence, France
Abstract :
A CMOS built-in current sensor is proposed. It is dedicated to mixed signal circuits power supply current monitoring. It takes advantage of a parasitic resistor, so its implementation is very transparent. Measurement results of a manufactured test chip highlight the behaviors of the sensor in terms of linearity, speed and noise.
Keywords :
CMOS integrated circuits; BIST; CMOS built-in current sensor; mixed signal circuits; online CMOS BICS; parasitic resistor; power supply current monitoring; Circuit testing; Current supplies; Linearity; Manufacturing; Monitoring; Noise measurement; Power supplies; Resistors; Semiconductor device measurement; Velocity measurement;
Conference_Titel :
IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-8123-3
DOI :
10.1109/IDDQ.1997.633019
