Title :
A high-speed low-voltage built-in current sensor
Author :
Huang, Tsung-Chu ; Huang, Min-Cheng ; Lee, Kuen-Jong
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.
Keywords :
CMOS logic circuits; CMOS logic; I/sub DDQ/ testing; area overhead; built-in current sensor; bulk-driven current mirror; power supply voltage drop; Circuit faults; Costs; Delay effects; Fault detection; Logic testing; Low voltage; Mirrors; Power supplies; Signal analysis; Threshold voltage;
Conference_Titel :
IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-8123-3
DOI :
10.1109/IDDQ.1997.633020
