• DocumentCode
    1801054
  • Title

    Formal proof between two designs having different level of abstraction

  • Author

    Maalej, Asma ; Martinez, Pierre-Yves

  • fYear
    2008
  • fDate
    25-27 March 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a solution for formal verification between two designs described at different levels of abstraction, thus containing sequential differences such as pipelining, timing constraints, interfaces, etc... Sequential Equivalence Checking allows in some case to perform formal proof between these design descriptions. SLEC (Calypto Design Systems, Inc) is a tool that offers an equivalence checker solution, able to compare an untimed algorithm description (C+ + level) versus its Register Transfer Level (RTL) implementation. This work consisted in interoperability testing the integration of SLEC inside a High-Level Synthesis (HLS) tool. This integration reduces verification time by eliminating testbenches and assertion creation. We will illustrate issues encountered and the way they were fixed through the formal proof run on LDPC encoder or UWB algorithms HLS synthesis results.
  • Keywords
    formal verification; hardware description languages; high level synthesis; open systems; parity check codes; pipeline arithmetic; Calypto Design Systems, Inc; HLS synthesis; LDPC encoder; SLEC; UWB algorithms; algorithm description; equivalence checker solution; formal proof; formal verification; high-level synthesis; interoperability testing; level of abstraction; pipelining; register transfer level implementation; sequential differences; sequential equivalence checking; timing constraints; Algorithm design and analysis; Application specific integrated circuits; Formal verification; High level synthesis; Logic; Mathematical analysis; Pipeline processing; System-level design; Testing; Timing; High-Level Synthesis; Sequential Equivalence Checking; formal proof;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology of Integrated Systems in Nanoscale Era, 2008. DTIS 2008. 3rd International Conference on
  • Conference_Location
    Tozeur
  • Print_ISBN
    978-1-4244-1576-2
  • Electronic_ISBN
    978-1-4244-1577-9
  • Type

    conf

  • DOI
    10.1109/DTIS.2008.4540253
  • Filename
    4540253