Title :
Formal proof between two designs having different level of abstraction
Author :
Maalej, Asma ; Martinez, Pierre-Yves
Abstract :
This paper presents a solution for formal verification between two designs described at different levels of abstraction, thus containing sequential differences such as pipelining, timing constraints, interfaces, etc... Sequential Equivalence Checking allows in some case to perform formal proof between these design descriptions. SLEC (Calypto Design Systems, Inc) is a tool that offers an equivalence checker solution, able to compare an untimed algorithm description (C+ + level) versus its Register Transfer Level (RTL) implementation. This work consisted in interoperability testing the integration of SLEC inside a High-Level Synthesis (HLS) tool. This integration reduces verification time by eliminating testbenches and assertion creation. We will illustrate issues encountered and the way they were fixed through the formal proof run on LDPC encoder or UWB algorithms HLS synthesis results.
Keywords :
formal verification; hardware description languages; high level synthesis; open systems; parity check codes; pipeline arithmetic; Calypto Design Systems, Inc; HLS synthesis; LDPC encoder; SLEC; UWB algorithms; algorithm description; equivalence checker solution; formal proof; formal verification; high-level synthesis; interoperability testing; level of abstraction; pipelining; register transfer level implementation; sequential differences; sequential equivalence checking; timing constraints; Algorithm design and analysis; Application specific integrated circuits; Formal verification; High level synthesis; Logic; Mathematical analysis; Pipeline processing; System-level design; Testing; Timing; High-Level Synthesis; Sequential Equivalence Checking; formal proof;
Conference_Titel :
Design and Technology of Integrated Systems in Nanoscale Era, 2008. DTIS 2008. 3rd International Conference on
Conference_Location :
Tozeur
Print_ISBN :
978-1-4244-1576-2
Electronic_ISBN :
978-1-4244-1577-9
DOI :
10.1109/DTIS.2008.4540253