Title :
Dependability consequences of fault-tolerant technique integrated in stack processor emulator using information flow approach
Author :
Jallouli, M. ; Belhadaoui, Hicham ; Diou, Christos ; Monteiro, Fabrice ; Malasse, O.
Author_Institution :
Lab. Interfaces, Capteurs et Microelectron., Univ. Paul Verlaine, Metz
Abstract :
Nowadays, electronic systems are becoming increasingly attractive for many applications. Such systems should be more and more dependable and require the evaluation and the improvement of their dependability parameters. In the continuity of the CETIM project [1], the principal objective is to define an integrated design of dependable mechatronic systems. In addition, the presence of programmable electronics imposes the existence of hardware/software interactions for the evaluation of dependability parameters. In this work we apply the informational flow approach [2] to evaluate some dependability parameters of a stack processor architecture in order to make adjustment during the co-design step. A VHDL- RTL modeling of the processor instruction set is done in order to carry on the information flow modeling. The probability of existence on different functional mode is estimated and discussed for 2 instructions. The first study concerns the instruction models without taking into account a fault-tolerant method. The second study concerns the same models but with taking into account this fault-tolerant method.
Keywords :
circuit CAD; fault tolerance; instruction sets; integrated circuit reliability; microprocessor chips; CETIM project; dependability consequences; dependable mechatronic systems design; electronic systems; fault-tolerant technique; information flow approach; information flow modeling; processor instruction set; programmable electronics; stack processor architecture; stack processor emulator; Benchmark testing; Computer aided instruction; Computer architecture; Control systems; Embedded system; Fault tolerance; Fault tolerant systems; Hardware; Laboratories; Mechatronics; IEC61508; VHDL-RTL modeling; device modeling; embedded systems; fault-tolerant; reliability issues; stack processor;
Conference_Titel :
Design and Technology of Integrated Systems in Nanoscale Era, 2008. DTIS 2008. 3rd International Conference on
Conference_Location :
Tozeur
Print_ISBN :
978-1-4244-1576-2
Electronic_ISBN :
978-1-4244-1577-9
DOI :
10.1109/DTIS.2008.4540256