Title :
ECC-Cache: A Novel Low Power Scheme to Protect Large-Capacity L2 Caches from Transiant Faults
Author_Institution :
Dept. of Comput., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
With dramatic scaling in feature size of VLSI technology, the capacity of on-chip L2 cache increases rapidly, how to guarantee the reliability of large capacity L2 cache has become an important issue. However, increasing the reliability of L2 cache tends to reduce its performance and brings more power consumption. This paper presents ECC-Cache, a novel low power fault-tolerant architecture which divided the traditional method of detecting and correcting errors using some uniform coding scheme into two steps, and uses a hybrid method which protects clean data and dirty data in different way to enhance the reliability of L2 cache. This paper also compares the performance and power consumption of ECC-Cache with that of some other proposed schemes, experimental results show that ECC-Cache is effective to guarantee the reliability of large-capacity L2 cache, while bringing little impact to system performance and power consumption. We find that ECC-Cache performs better than the uniform-ECC scheme adopted in some widespread used commercial processors and some proposed schemes in other papers. Compared with the cache which has no protection, ECC-Cache only consumes 3% to 6% additional power and degrades performance no more than 2%.
Keywords :
VLSI; cache storage; error correction; error detection; fault tolerant computing; microprocessor chips; parallel architectures; power aware computing; ECC-Cache; L2 cache reliability; VLSI technology; commercial processors; error correction; error detection; low power fault-tolerant architecture; on-chip L2 cache; power consumption; transient fault; uniform coding scheme; Circuit faults; Degradation; Encoding; Energy consumption; Fault detection; Fault tolerance; Power system reliability; Protection; System performance; Very large scale integration; cache architecture; fault tolerant; reliability; transient fault;
Conference_Titel :
Information Assurance and Security, 2009. IAS '09. Fifth International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-0-7695-3744-3
DOI :
10.1109/IAS.2009.354