Title :
Characterization of single event effects for the AD677, 16-bit A/D converter
Author :
Wilson, David J. ; Dorn, David A.
Author_Institution :
Ball Aerosp. Syst. Group, Boulder, CO, USA
Abstract :
The AD677 demonstrated four types of single event effects (SEE): temporary data errors due to single event upsets (SEU) in the Analog die; temporary data errors due to SEU´s in the Digital die; lingering data errors due to SEUs in the Digital die and a nondestructive, self-correcting latchup mode in the Digital die. This report presents the results.
Keywords :
BiCMOS integrated circuits; CMOS integrated circuits; analogue-digital conversion; mixed analogue-digital integrated circuits; radiation effects; space vehicle electronics; 16 bit; A/D converter; AD677; CMOS/BiCMOS hybrid; analog die; digital die; lingering data errors; self-correcting latchup mode; single event effects; single event upsets; space vehicles; temporary data errors; Analog-digital conversion; Capacitors; Charge-coupled image sensors; Digital signal processing; Error correction; Instruments; Single event upset; Space missions; Telescopes; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 1994 IEEE
Print_ISBN :
0-7803-2022-0
DOI :
10.1109/REDW.1994.633039
