DocumentCode
1802658
Title
VrtProf: Vertical Profiling for System Virtualization
Author
Mousa, Hussam ; Doshi, Kshitij ; Sherwood, Timothy ; Ould-Ahmed-Vall, ElMoustapha
Author_Institution
Dept. of Comput. Sci., Univ. of California, Santa Barbara, CA, USA
fYear
2010
fDate
5-8 Jan. 2010
Firstpage
1
Lastpage
10
Abstract
As data centers and end users become increasingly reliant on virtualization technology, more efficient and accurate methods of profiling such systems are needed. However, under virtualization the virtual machine and OS each try to manage the same resources independently, the underlying hardware is now multiplexed between many streams of execution, and non-trivial interference can be caused by seemingly unrelated resources. While sampling techniques are effective at gathering average behaviors over long runs, understanding the time-varying behavior of programs under virtualization, the correlation between events at the level of program phases, or the transient effects of rare events requires a new way of profiling virtualized applications. To this end we present VrtProf, a low overhead profiling tool that automates the collection of hardware and software events spanning the vertical execution stack, including the hardware, the virtual machine monitor, the guest kernels, and applications at very fine time scales. We describe the many challenges faced while developing VrtProf, the design of the resulting tool, and how it can be used in practice on several multi-programmed workloads both as virtualized and native executions. We show that VrtProf introduces negligible performance overhead of only 1.2% while capturing the time-varying application behavior with interval granularities as small as a few thousand cycles.
Keywords
multiprogramming; operating system kernels; time-varying systems; virtual machines; VrtProf; data centers; guest kernels; multiprogrammed workloads; nontrivial interference; operating system; overhead profiling tool; sampling techniques; software event spanning; system virtualization; time-varying behavior; vertical profiling; virtual machine monitor; Application software; Application virtualization; Hardware; Interference; Resource management; Resource virtualization; Sampling methods; Software tools; Virtual machine monitors; Virtual machining;
fLanguage
English
Publisher
ieee
Conference_Titel
System Sciences (HICSS), 2010 43rd Hawaii International Conference on
Conference_Location
Honolulu, HI
ISSN
1530-1605
Print_ISBN
978-1-4244-5509-6
Electronic_ISBN
1530-1605
Type
conf
DOI
10.1109/HICSS.2010.440
Filename
5428518
Link To Document