DocumentCode
1802750
Title
A new set of signal processing algorithms in laser speckle metrology
Author
Schneider, Sebastian C. ; Rupitsch, Stefan ; Zagar, Bernhard G.
Author_Institution
Inst. for Meas. Technol., Johannes Kepler Univ., Linz, Austria
Volume
2
fYear
2004
fDate
18-20 May 2004
Firstpage
1338
Abstract
Non-contacting methods for strain and displacement measurement are now well established, although not in very wide spread use in material science applications. Besides other methods, laser speckle pattern shift techniques can be successfully used for strain and displacement measurements. Using such a technique, one is confronted with the problem of calculating speckle pattern shift values from a time series of images. In this paper, we present a new set of algorithms based on minimum-mean-square error and maximum likelihood principles suitable for this task. We show their application in two different strain and displacement measurement set-ups.
Keywords
displacement measurement; least mean squares methods; maximum likelihood estimation; measurement by laser beam; speckle; strain measurement; time series; displacement measurement; image time series; laser speckle metrology signal processing; laser speckle pattern shift techniques; maximum likelihood principles; minimum-mean-square error methods; noncontact measurement methods; strain measurement; Cameras; Capacitive sensors; Displacement measurement; Metrology; Optical sensors; Optical surface waves; Rough surfaces; Signal processing algorithms; Speckle; Strain measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
ISSN
1091-5281
Print_ISBN
0-7803-8248-X
Type
conf
DOI
10.1109/IMTC.2004.1351313
Filename
1351313
Link To Document