DocumentCode :
1802750
Title :
A new set of signal processing algorithms in laser speckle metrology
Author :
Schneider, Sebastian C. ; Rupitsch, Stefan ; Zagar, Bernhard G.
Author_Institution :
Inst. for Meas. Technol., Johannes Kepler Univ., Linz, Austria
Volume :
2
fYear :
2004
fDate :
18-20 May 2004
Firstpage :
1338
Abstract :
Non-contacting methods for strain and displacement measurement are now well established, although not in very wide spread use in material science applications. Besides other methods, laser speckle pattern shift techniques can be successfully used for strain and displacement measurements. Using such a technique, one is confronted with the problem of calculating speckle pattern shift values from a time series of images. In this paper, we present a new set of algorithms based on minimum-mean-square error and maximum likelihood principles suitable for this task. We show their application in two different strain and displacement measurement set-ups.
Keywords :
displacement measurement; least mean squares methods; maximum likelihood estimation; measurement by laser beam; speckle; strain measurement; time series; displacement measurement; image time series; laser speckle metrology signal processing; laser speckle pattern shift techniques; maximum likelihood principles; minimum-mean-square error methods; noncontact measurement methods; strain measurement; Cameras; Capacitive sensors; Displacement measurement; Metrology; Optical sensors; Optical surface waves; Rough surfaces; Signal processing algorithms; Speckle; Strain measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-8248-X
Type :
conf
DOI :
10.1109/IMTC.2004.1351313
Filename :
1351313
Link To Document :
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