DocumentCode :
1802895
Title :
A Fast Backlight Module Luminance Inspection Method
Author :
Lin, Wu-Ja ; Ho, Chih-Wei
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Formosa Univ., Huwei Township, Taiwan
Volume :
1
fYear :
2009
fDate :
29-31 Aug. 2009
Firstpage :
362
Lastpage :
367
Abstract :
In this paper, a fast backlight module luminance inspection method is proposed. The proposed method inspects various backlight modules at once and all check points within the backlight modules are examined. Comparing to the traditional method which inspects one check point at a time, the proposed method is fast. The experimental results show that the proposed method usually yields satisfactory results.
Keywords :
brightness; cameras; inspection; camera; check points; digital image; fast backlight module luminance inspection method; image intensities; Computer displays; Computer science; Digital cameras; Digital images; Fixtures; Image recognition; Inspection; Liquid crystal displays; Operating systems; Production; backlight module; image processing; luminance inspection; neural network; pattern recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Science and Engineering, 2009. CSE '09. International Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4244-5334-4
Electronic_ISBN :
978-0-7695-3823-5
Type :
conf
DOI :
10.1109/CSE.2009.291
Filename :
5283244
Link To Document :
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