Title :
A pipelined temporal difference imager
Author :
Gruev, Viktor ; Etienne-Cummings, Ralph
Author_Institution :
Dept. of Electr. & Comput. Eng., Johns Hopkins Univ., Baltimore, MD, USA
Abstract :
A 189×182 Active Pixel Sensor (APS) for temporal difference computation is presented. The temporal difference imager (TDI), fabricated in AMI 0.5 μ process, contains in-pixel storage elements for previous and current frames. A correlated double sampling circuit is used to suppress the fixed pattern noise on both images and direct difference on the corrected images is also computed. The pixel area occupies 25 μ by 25 μ, with fill factor of 30%. An efficient pipeline architecture for difference readout is implemented, allowing 8 bit precision of the difference imager and low temporal drop between the stored and current images. The chip consumes 30 mW at 50 fps from 5 V power supply
Keywords :
CMOS image sensors; low-power electronics; pipeline processing; 0.5 micron; 182 pixel; 189 pixel; 30 mW; 5 V; 5 V power supply; 50 fps; 8 bit precision; AMI 0.5 μ process; CMOS APS imager; correlated double sampling circuit; difference imager; difference readout; fill factor 30%; fixed pattern noise; in-pixel storage; pipeline architecture; pixel area; power consumption 30 mW; temporal difference imager; CMOS image sensors; CMOS process; Circuits; Computer architecture; Delay effects; Image sampling; Image storage; Pipelines; Registers; Timing;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Conference_Location :
Phoenix-Scottsdale, AZ
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010316
