DocumentCode :
1802939
Title :
High-resolution X-ray spectromicroscopy of fs laser-produced plasma by tunable, high-luminosity spherical crystal spectrometers with X-ray CCD or MCP
Author :
Pikuz, T.A. ; Faenov, A.Y. ; Magunov, A. ; Skobelev, I.Y. ; Blasco, F. ; Stenz, C. ; Salin, F. ; Monot, P. ; Auguste, T. ; Dobosz, S. ; Oliveira, D. ; Hulin, S. ; Bougeard, M.
Author_Institution :
BMSTU, Moscow, Russia
fYear :
2001
fDate :
17-22 June 2001
Firstpage :
387
Abstract :
Summary form only given, as follows. We present first results of fs laser-produced plasma diagnostics, which were obtained by using Focusing Spectrometer with Spatial Resolution having as an X-ray detector Princeton X-ray CCD or Hamamatsu X-ray MCP. A portable (200/spl times/100/spl times/100 mm3), high-luminosity spherically bent crystal spectrometer was designed for the purposes of measuring in wide spectral range 1.2-19.6 E very low emissivity X-Ray spectra of different targets, heated by fs laser radiation, with simultaneously high spectral (l/spl exist/dl/spl sim/1000-5000) and space (40-200 mm) resolution. Large open aperture mica spherically bent crystals (30/spl times/10 mm2 and 50/spl times/15 mm2 with R=100 and 150 mm, correspondingly) are used as a disperisve element of spectrometer. High spectrometer tunability allowed to receive high-resolved spectra of clusters or solids, heated by 35 or 60 fs Ti:sapphire laser pulses in spectral ranges: 15 - 17 E - for H- and He-like ions of Oxygen and Fluorine, 7.6- 8.75 E - for spectra between Hea and Ka lines of Al and near Rydberg lines of Ne-like Cu, 5 - 5.7 E - for Ne-like like ions spectra of Kr, 3.0 - 4.4 E - for H- and He-like spectra of Ar and spectra around Ka of Ca, 1.38 - 1.59 E - for Ka lines of Cu without any realignment of spectrometer. Thanks to the high sensitivity of the spectrometer with MCP, high quality spectrally resolved images of Fluorine and Al could be obtained only in I shot of Ti:Sa laser with energy of laser pulse about 600 mJ and pulse duration 60 fs. Some results of plasma diagnostics for both cases of clusters and solid targets, heated by fs laser radiation will be presented and discussed.
Keywords :
X-ray spectra; plasma diagnostics; plasma production by laser; 600 mJ; MCP; Rydberg lines; Ti:sapphire laser pulses; X-ray CCD; X-ray detector; X-ray spectra; clusters; focusing spectrometer; high-resolution X-ray spectromicroscopy; high-resolved spectra; laser radiation; laser-produced plasma diagnostics; mica; plasma diagnostics; solids; spatial resolution; spectrometer tunability; tunable high-luminosity spherical crystal spectrometers; Focusing; Optical pulses; Plasma diagnostics; Plasma x-ray sources; Solid lasers; Space heating; Spatial resolution; Spectroscopy; X-ray detectors; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7141-0
Type :
conf
DOI :
10.1109/PPPS.2001.961110
Filename :
961110
Link To Document :
بازگشت