DocumentCode
1802965
Title
Development of a new analysis algorithm based on the wavelet transforms for noisy Langmuir-probe traces
Author
Kim, Youngjae ; Kim, Gon-Ho ; Kim, D.-G.
fYear
2001
fDate
17-22 June 2001
Firstpage
387
Abstract
Summary form only given, as follows. Analysis algorithm of an electrical Langmuir probe data has been developed. Most algorithms requires the user specified input values for selecting the ion saturation, electron saturation, and intermediate regions to find the ion, electron density, plasma potential, and plasma temperature, respectively. However, the input values may cause a lack of reproducibility to analyze the probe data. When a noise is included into the probe signal, it is almost impossible to obtain the reliable plasma parameters from the probe data. In this work, a new algorithm is developed with the wavelet transforms to filter out the nose signal from the probe data and to determine the plasma parameters. A biorthogonal wavelet transform applies to determine the initial plasma potential and Daubechies wavelet is to obtain the electron and ion saturation currents. Electron energy distribution function (EEDF) or electron energy probability function (EEPF) can obtain clearly from the processed raw data by a biorthogonal wavelet transform. This algorithm is not necessary to require the user´s input values to analysis, thus it can be reduced an uncertainty from data analysis. With artificial data set including a random noise, the performance of this programs is evaluated and the result shows more than 95% accuracy.
Keywords
Langmuir probes; plasma density; plasma temperature; wavelet transforms; analysis algorithm; electrical Langmuir probe; electron density; electron energy distribution function; electron energy probability function; electron saturation; electron saturation currents; ion saturation; ion saturation currents; noisy Langmuir-probe traces; plasma potential; plasma temperature; wavelet transforms; Algorithm design and analysis; Data analysis; Electrons; Plasma density; Plasma temperature; Plasma waves; Probes; Reproducibility of results; Wavelet analysis; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location
Las Vegas, NV, USA
Print_ISBN
0-7803-7141-0
Type
conf
DOI
10.1109/PPPS.2001.961111
Filename
961111
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