DocumentCode :
1803332
Title :
The random effect of electrical noise on T wave alternans
Author :
Hsia, Peng-Wie E. ; Hyatt, Christopher J. ; Fendelander, Lahn ; Damiano, Ralph J., Jr.
Author_Institution :
Med. Coll., Virginia Commonwealth Univ., Richmond, VA, USA
fYear :
1994
fDate :
25-28 Sept. 1994
Firstpage :
709
Lastpage :
712
Abstract :
This study was designed to examine the effect of random noise on the nonparametric power spectrum estimation of beat-to-beat alternations in the electrocardiogram (ECG). It has been widely assumed that random noise is additive to the power spectrum contribution of a beat-to-beat alternating signal. In this study, alternans of the T wave was used to simulate a subtle beat-to-beat alternating signal present in the ECG. Pseudorandom noise was then superimposed on the alternans and a nonparametric power spectrum estimation technique, the Welch method, was used to quantify the amount of T wave alternans present. The study showed that in 34 of 100 pseudorandom noise simulations, the degree of alternans of the T wave detected was decreased when compared to the case where only alternans of the T wave was present without added noise. Thus, assuming that the random noise power spectrum component (at 0.5 cpb) is always additive to the T wave alternans power spectrum component may lend to significant errors in interpretation of the results of power spectrum estimation when applied to the analysis of subtle beat-to-beat fluctuations in the electrocardiogram.<>
Keywords :
electrocardiography; medical signal processing; random noise; spectral analysis; ECG beat-to-beat alternations; T wave alternans; Welch method; electrical noise random effect; interpretation errors; power spectrum; subtle beat-to-beat fluctuations; Additive noise; Analytical models; Educational institutions; Electrocardiography; Fluctuations; Frequency estimation; Signal analysis; Spectral analysis; Surface morphology; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computers in Cardiology 1994
Conference_Location :
Bethesda, MD, USA
Print_ISBN :
0-8186-6570-X
Type :
conf
DOI :
10.1109/CIC.1994.470087
Filename :
470087
Link To Document :
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