DocumentCode :
1803481
Title :
Experimental results in evolutionary fault-recovery for field programmable analog devices
Author :
Zebulum, Ricardo S. ; Keymeulen, Didier ; Duong, Vu ; Guo, Xin ; Ferguson, M.I. ; Stoica, Adrian
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear :
2003
fDate :
9-11 July 2003
Firstpage :
182
Lastpage :
186
Abstract :
This paper presents experimental results of fast intrinsic evolutionary design and evolutionary fault recovery of a 4-bit digital to analog converter (DAC) using the JPL stand-alone board-level evolvable system (SABLES). SABLES is part of an effort to achieve integrated evolvable systems and provides autonomous, fast (tens to hundreds of seconds), on-chip evolution involving about 100,000 circuit evaluations. Its main components are a JPL field programmable transistor array (FPTA) chip used as transistor-level reconfigurable hardware, and a TI DSP that implements the evolutionary algorithm controlling the FPTA reconfiguration. The paper describes an experiment consisting of the hierarchical evolution of a 4-bit DAC using 20 cells of the FPTA chip. Fault-recovery is demonstrated after applying stuck-at 0 faults to all switches of one particular cell, and using evolution to recover functionality. It is verified that the functionality can be recovered in less than one minute after the fault is detected while the evolutionary design of the 4-bit DAC from scratch took about 3 minutes.
Keywords :
digital-analogue conversion; evolutionary computation; fault tolerant computing; field programmable analogue arrays; system recovery; system-on-chip; 4-bit digital to analog converter; FPTA chip; FPTA reconfiguration; JPL field programmable transistor array; JPL stand-alone board-level evolvable system; SABLES; circuit evaluation; evolutionary algorithm; evolutionary fault recovery; fault detection; field programmable analog device; functionality recovery; hierarchical evolution; intrinsic evolutionary design; on-chip evolution; transistor-level reconfigurable hardware; Aerospace engineering; Circuit faults; Digital signal processing chips; Failure analysis; Fault detection; Hardware; Space technology; Space vehicles; Switches; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Evolvable Hardware, 2003. Proceedings. NASA/DoD Conference on
Print_ISBN :
0-7695-1977-6
Type :
conf
DOI :
10.1109/EH.2003.1217665
Filename :
1217665
Link To Document :
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