Title :
Characterization of a cryogenically cooled Silicon Germanium HBT amplifier
Author :
Cao, A.Q. ; Liu, K. ; Chen, S.H. ; Shi, S.C.
Author_Institution :
Purple Mountain Obs., NAOC, Beijing
Abstract :
In this paper, the gain and noise performances of a DC-6 GHz microwave amplifier using commercial Silicon Germanium Heterostructure Bipolar Transistor (SiGe HBT) are investigated at different bath temperatures. At room temperature, the two-stage amplifier has a gain of 21 dB and a noise figure of 3.7 dB at 2.62 GHz. When cooled to 70 K, it demonstrates 27 dB gain and 1.5 dB noise figure at the same frequency. The gain and noise figure of another three-stage amplifier at room temperature are 34.5 dB, 3.7 dB at 2.64 GHz, respectively. When cooled to 130 K, the gain goes up to 37.5 dB; when cooled to 170 K, the noise figure goes down to 2.4 dB. The higher gain and better noise figure of this amplifier are obtained when the ambient temperature decreases.
Keywords :
Ge-Si alloys; heterojunction bipolar transistors; microwave amplifiers; noise; semiconductor materials; HBT; SiGe; frequency 2.62 GHz; frequency 2.64 GHz; gain 21 dB; gain 27 dB; gain 34.5 dB; gain 37.5 dB; microwave amplifier; noise figure 1.5 dB; noise figure 2.4 dB; noise figure 3.7 dB; silicon germanium heterostructure bipolar transistor; temperature 130 K; temperature 170 K; temperature 293 K to 298 K; temperature 70 K; three-stage amplifier; two-stage amplifier; Extraterrestrial measurements; Frequency; Germanium silicon alloys; Heterojunction bipolar transistors; Noise figure; Noise measurement; Radiofrequency amplifiers; Silicon germanium; Superconducting device noise; Temperature sensors; cryogenically cooled; gain; microwave amplifier; noise;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-1879-4
Electronic_ISBN :
978-1-4244-1880-0
DOI :
10.1109/ICMMT.2008.4540350