DocumentCode
1803519
Title
Application of Bayesian neural network in electrical impedance tomography
Author
Lampinen, Jouko ; Vehtari, Aki ; Leinonen, Kimmo
Author_Institution
Lab. of Comput. Eng., Helsinki Univ. of Technol., Espoo, Finland
Volume
6
fYear
1999
fDate
36342
Firstpage
3942
Abstract
In this contribution we present a method for solving the inverse problem in electric impedance tomography with neural networks. The problem of reconstructing the conductivity distribution inside an object from potential measurements on the surface is known to be ill-posed requiring efficient regularization techniques. We demonstrate that a statistical inverse solution, where the mean of the inverse mapping is approximated with a neural network gives promising results. We study the effect of input and output data representation by simulations and conclude that projection to principal axis is feasible data transformation. Also we demonstrate that Bayesian neural networks, which aim to average over all network models weighted by the model´s posterior probability provide the best reconstruction results. With the presented approach estimation of some target variables, such as the void fraction (the ratio of gas and liquid), may be applicable directly without the actual image reconstruction. We also demonstrate that the solutions are very robust against noise in inputs
Keywords
Bayes methods; electric impedance imaging; image processing; inverse problems; neural nets; statistical analysis; Bayesian neural network; conductivity distribution reconstruction; efficient regularization techniques; electrical impedance tomography; feasible data transformation; inverse problem; posterior probability; potential measurements; principal axis; statistical inverse solution; void fraction; Bayesian methods; Electrodes; Image reconstruction; Intelligent networks; Inverse problems; Neural networks; Noise robustness; Surface impedance; Surface reconstruction; Tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 1999. IJCNN '99. International Joint Conference on
Conference_Location
Washington, DC
ISSN
1098-7576
Print_ISBN
0-7803-5529-6
Type
conf
DOI
10.1109/IJCNN.1999.830787
Filename
830787
Link To Document