DocumentCode :
1803740
Title :
Low cost infrared temperature measurement and optimal process control in microwave sintering systems
Author :
Calame, J.P. ; Carmel, Y. ; Pert, E. ; Gershon, D.
Author_Institution :
Inst. for Plasma Res., Maryland Univ., College Park, MD, USA
fYear :
1997
fDate :
19-22 May 1997
Firstpage :
159
Abstract :
Summary form only given. Ceramic sintering based on microwave heating has the potential to create final products with unique mechanical and electrical properties. This results from the rapid heating cycles which are made possible by the volumetric heating nature of microwaves. An important issue for industrial systems involves the non-contact measurement of temperature at multiple positions in a cost-effective manner. We have been experimentally investigating the application of direct detecting, commercial infrared thermocouples to this problem. We have designed and implemented a system using a series of these detectors in conjunction with movable gold mirrors and BaF/sub 2/ optical components (which operate to wavelengths as long as 20 microns). Experiments comparing the accuracy and reproducibility of this system to conventional thermocouples and optical pyrometers are described for several materials.
Keywords :
ceramics; closed loop systems; microwave heating; optimal control; plasma applications; process control; real-time systems; sintering; spectral methods of temperature measurement; temperature control; thermocouples; 20 mum; Au; BaF/sub 2/; BaF/sub 2/ optical components; ceramic sintering; commercial IR thermocouples; cost-effective manner; direct detecting; electrical properties; industrial systems; infrared temperature measurement; mechanical properties; microwave heating; microwave sintering systems; movable Au mirrors; noncontact measurement; optical pyrometers; optimal process control; rapid heating cycles; thermocouples; volumetric heating; Ceramics; Cost function; Electrical products industry; Electromagnetic heating; Infrared detectors; Mechanical factors; Optical design; Position measurement; Resistance heating; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3990-8
Type :
conf
DOI :
10.1109/PLASMA.1997.604467
Filename :
604467
Link To Document :
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