DocumentCode
180379
Title
12.5 THz Fco GeTe Inline Phase-Change Switch Technology for Reconfigurable RF and Switching Applications
Author
El-Hinnawy, Nabil ; Borodulin, Pavel ; Jones, Evan B. ; Wagner, Brian P. ; King, Matthew R. ; Mason, John S. ; Bain, James ; Paramesh, Jeyanandh ; Schlesinger, T.E. ; Howell, Robert S. ; Lee, M.J. ; Young, Robert M.
Author_Institution
Northrop Grumman Electron. Syst., Linthicum, MD, USA
fYear
2014
fDate
19-22 Oct. 2014
Firstpage
1
Lastpage
3
Abstract
Improvements to the GeTe inline phase-change switch (IPCS) technology have resulted in a record-performing radio-frequency (RF) switch. An ON-state resistance of 0.9 Ω (0.027 Ω·mm) with an OFF-state capacitance and resistance of 14.1 fF and 30 kΩ, respectively, were measured, resulting in a calculated switch cutoff frequency (Fco) of 12.5 THz. This represents the highest reported Fco achieved with chalcogenide switches to date. The threshold voltage (Vth) for these devices was measured at 3V and the measured third-order intercept point (TOI) was 72 dBm. Single-pole, single-throw (SPST) switches were fabricated, with a measured insertion loss less than 0.15 dB in the ON-state, and 15dB isolation in the OFF-state at 18 GHz. Single-pole, double-throw (SPDT) switches were fabricated using a complete backside process with through-substrate vias, with a measured insertion loss 0.25 dB, and 35dB isolation.
Keywords
germanium alloys; microwave switches; phase change materials; tellurium alloys; GeTe; SPDT switch; SPST switch; Single pole single throw switch; capacitance 14.1 fF; chalcogenide switch; frequency 12.5 GHz; frequency 18 GHz; inline phase change switch technology; loss 0.25 dB; radio frequency switch; reconfigurable RF applications; resistance 30 kohm; single pole double throw switch; switching applications; Insertion loss; Loss measurement; Optical switches; Phase change materials; Radio frequency; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductor Integrated Circuit Symposium (CSICs), 2014 IEEE
Conference_Location
La Jolla, CA
Type
conf
DOI
10.1109/CSICS.2014.6978522
Filename
6978522
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