DocumentCode :
1803848
Title :
Test methodology for low power VLSI neural oscillator circuit
Author :
Lee, Young Jun ; Lee, Jihyun ; Heo, Jaeyoung ; Zhang, Fengming ; Kim, Yong Bin ; Lombardi, F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Volume :
2
fYear :
2004
fDate :
18-20 May 2004
Firstpage :
1546
Abstract :
This paper presents new test and verification methodologies, including design techniques targeting a neural oscillator. Because the output signal of a neuron is chaotic, customized verification and test methodologies are required. We have chosen to use MATLAB to verify our experimental results at a simulation level. In this paper we also describe a test circuit used to perform electronic neuron IC testing. We investigate how a subthreshold circuit can reduce power consumption. In our HSPICE simulations, we both validate the proposed test circuit and verify the electronic neuron and synapse circuit.
Keywords :
VLSI; chaos; integrated circuit testing; low-power electronics; neural nets; oscillators; CMOS technology; VLSI; electronic neuron IC testing; electronic synapse circuit; low power oscillator; neural oscillator test; neuron chaotic output signal; power consumption reduction; subthreshold circuit; verification; Chaos; Circuit simulation; Circuit testing; Design methodology; Electronic equipment testing; Integrated circuit testing; MATLAB; Neurons; Oscillators; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-8248-X
Type :
conf
DOI :
10.1109/IMTC.2004.1351360
Filename :
1351360
Link To Document :
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