Title :
Designing reliable analog circuits in an unreliable world
Author :
Gielen, Georges G E ; Maricau, Elie ; De Wit, Pieter
Author_Institution :
Katholieke Univ. Leuven, Leuven, Belgium
Abstract :
Reliability is one of the major concerns in designing integrated circuits in deep nanometer CMOS technologies. Problems related to transistor aging like BTI or soft breakdown cause time-dependent circuit performance degradation. Variability only makes these things more severe. This creates a need for innovative design techniques and tools that help designers coping with these reliability and variability problems. This invited overview paper gives a brief description of device aging models. It also presents tools for the efficient analysis and identification of reliability problems in analog circuits. Finally, it proposes solutions for the design of resilient, self-healing circuits.
Keywords :
CMOS analogue integrated circuits; ageing; analogue integrated circuits; integrated circuit design; integrated circuit reliability; BTI; deep nanometer CMOS technologies; device aging models; integrated circuit design; reliability problems; reliable analog circuits; self-healing circuits; soft breakdown; time-dependent circuit performance degradation; transistor aging; unreliable world; variability problems; Analog circuits; CMOS integrated circuits; Degradation; Integrated circuit modeling; Reliability; Stress; Transistors;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330571