Title :
A 7b 1.4GS/s ADC with offset drift suppression techniques for one-time calibration
Author :
Nakajima, Yuji ; Kato, Norihito ; Sakaguchi, Akemi ; Ohkido, Toshio ; Shimomaki, Kenji ; Masuda, Hiroko ; Shiroma, Chikahiro ; Yotsuyanagi, Michio ; Miki, Takahiro
Abstract :
A 7b 1.4 GS/s flash ADC is developed in 45 nm CMOS. This is the first paper of an ADC with offset drift suppression techniques for dynamic comparator and preamplifier. These techniques make the ADC robust against environmental variation. As a result, once the ADC is calibrated at power up, no more calibration is necessary even under VDD or temperature variations. The ADC occupies a small area of 0.085 mm2 and dissipates 33.24 mW at 1.4 GS/s from a 1.15V supply.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; comparators (circuits); preamplifiers; CMOS; VDD; dynamic comparator; environmental variation; flash ADC; offset drift suppression techniques; one-time calibration; power 33.24 mW; preamplifier; size 45 nm; temperature variations; voltage 1.15 V; Ash; Calibration; Clocks; Radiation detectors; Temperature dependence; Temperature measurement; Transistors;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330608
