• DocumentCode
    1805160
  • Title

    An expression of critical pressure in SF6-filled point/plane gaps

  • Author

    Gu, Wenguo ; Wang, Pei ; Zhang, Qiaogen ; Qiu, Yuchang ; Feng, Yunping

  • Author_Institution
    Sch. of Electr. Eng., Xi´´an Jiaotong Univ., China
  • Volume
    1
  • fYear
    1998
  • fDate
    7-10 Jun 1998
  • Firstpage
    313
  • Abstract
    A new method for calculating low probability impulse breakdown voltages is put forward, which consists of three limiting lines: the streamer breakdown line, the low probability impulse breakdown level and the streamer corona onset line in different gas pressure ranges. The streamer breakdown line and the streamer corona onset line can be calculated using the basic knowledge of SF6 gas insulation. If the critical pressure Pc is known, then the low probability impulse breakdown level can be predicted, because the streamer corona onset voltage and the low probability impulse breakdown voltage are of almost the same value at Pc. So the expression of Pc is very useful for insulation design. In this paper, different point/plane gaps are tested, and an expression of Pc is derived based on the experimental results. Compared with the measured values for given gaps, the calculated values have a relative error no more than 2%
  • Keywords
    SF6 insulation; corona; discharges (electric); electric breakdown; impulse testing; insulation testing; SF6; SF6 gas insulation; SF6-filled point/plane gaps; critical pressure; gas pressure ranges; insulation design; limiting lines; low probability impulse breakdown level; low probability impulse breakdown voltages; streamer breakdown line; streamer corona onset line; Breakdown voltage; Corona; Electric breakdown; Electrodes; Gas insulation; Lightning; Low voltage; Probability; Sulfur hexafluoride; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-4927-X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1998.704727
  • Filename
    704727