Experimental evaluation of IGBTs for characterizing and modeling conducted EMI emission in PWM inverters

Author

Liu, Quanwei ; Shen, W. ; Wang, F. ; Boroyevich, D. ; Stefanovic, V. ; Arpilliere, M.

Author_Institution

Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA

Volume

4

fYear

2003

fDate

15-19 June 2003

Firstpage

1951

Abstract

As a step to achieve the objective of predicting electromagnetic interference (EMI) noise in IGBT PWM inverters, this paper proposes a new and practical EMI noise source modeling method. An equivalent Thevenin source in the frequency-domain, including the voltage source and source impedance, is employed to model the main EMI noise emission source - the IGBT switching. The modeling approach for both the differential mode (DM) and common mode (CM) noise source is studied. The methodology is verified experimentally using a simple, controlled testbed. The important issues on measurement repeatability and data processing are also investigated and discussed.

Keywords

PWM invertors; electric noise measurement; electromagnetic interference; equivalent circuits; insulated gate bipolar transistors; power semiconductor switches; switching convertors; two-port networks; EMI; IGBT switching; PWM inverters; common mode noise; differential mode noise; electromagnetic interference; equivalent Thevenin source; frequency-domain; noise; source modeling method; testbed; voltage source impedance; Data processing; Delta modulation; Electromagnetic interference; Electromagnetic modeling; Impedance; Insulated gate bipolar transistors; Predictive models; Pulse width modulation inverters; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Electronics Specialist Conference, 2003. PESC '03. 2003 IEEE 34th Annual

ISSN

0275-9306

Print_ISBN

0-7803-7754-0

Type

conf

DOI

10.1109/PESC.2003.1217751

Filename

1217751