• DocumentCode
    1805700
  • Title

    A S-D Logic Based Approach to Input-Output Analysis for Technology Spillover

  • Author

    Hsieh, Yen-Hao ; Yuan, Soe-Tysr

  • Author_Institution
    Manage. Inf. Syst., Nat. Chengchi Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    5-8 Jan. 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Technology spillovers can generate positive effects on industries which have been an important issue within the production based (or goods-dominant logic) disciplines, such as in the manufacture industries. The input-output analysis has been considered as a good way to explore and measure the effects of technology spillover. Nevertheless, in the current service-economics and experience era, service industries play an essential role and thus the spread of the service technologies would also become an important topic to investigate. The service-dominant logic (so-called S-D logic) underlying the service industries emphasizes customer involvement that however was not regarded in the traditional input-output analysis approach. Consequently, this paper aims to present an S-D logic based approach of the analysis in order to systematically explore and measure the effects of technology spillover in services. Furthermore, this paper uses a case study to demonstrate the contributions of the approach and its anticipated impacts to service innovation.
  • Keywords
    innovation management; quality of service; service industries; S-D logic based approach; input-output analysis approach; manufacture industries; quality of service; service economics; service industries; service innovation; service-dominant logic; technology spillover; Appropriate technology; Companies; Information analysis; Logic; Machinery production industries; Management information systems; Manufacturing automation; Manufacturing industries; Productivity; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Sciences (HICSS), 2010 43rd Hawaii International Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1530-1605
  • Print_ISBN
    978-1-4244-5509-6
  • Electronic_ISBN
    1530-1605
  • Type

    conf

  • DOI
    10.1109/HICSS.2010.30
  • Filename
    5428631