• DocumentCode
    1805744
  • Title

    Safety grounding approach for the NIF power conditioning system

  • Author

    Hammon, J. ; Fulkerson, E.S. ; Newton, M. ; Gagnon, B. ; Anderson, Richard

  • Author_Institution
    Maxwell/Physics Int., USA
  • fYear
    2001
  • fDate
    17-22 June 2001
  • Firstpage
    443
  • Abstract
    Summary form only given, as follows. This paper describes a set of analyses and tests performed to evaluate approaches to provide a safe and robust grounding approach for the main power conditioning system in the NIF facility presently under construction at the Lawrence Livermore National Laboratory. The Power Conditioning System consists of up to 192 capacitor bank modules, each storing 2.2 MJ and capable of producing a peak current over 500 kA. The grounding system must minimize touch potentials associated with operation of the Power Conditioning System. In the event of severe faults, the system must assure that the energy delivered to a person through contact with "grounded" structures is very low. Based on computer modeling and low-voltage, low-current tests, we have concluded that the most effective approach is a set of metal enclosures around the output cables (effectively heavy-wall closed cable trays) extending from the capacitor bank modules to their flashlamp loads. This paper will discuss the safety standards identified for this application, the approach to meeting the standards, and the predicted performance of the safety system.
  • Keywords
    capacitor storage; pulsed power supplies; 2.2 MJ; 500 kA; capacitor bank modules; computer modeling; flashlamp loads; grounded structures; heavy-wall closed cable trays; low-voltage low-current tests; metal enclosures; power conditioning system; safety grounding approach; Cables; Capacitors; Grounding; Laboratories; Performance analysis; Performance evaluation; Power conditioning; Robustness; Safety; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
  • Conference_Location
    Las Vegas, NV, USA
  • Print_ISBN
    0-7803-7141-0
  • Type

    conf

  • DOI
    10.1109/PPPS.2001.961203
  • Filename
    961203