Title :
Structural, morphological and optical properties of pulse plated CdSe nano films
Author :
Saaminathan, V. ; Arunagiri, Anand ; Murali, K.R.
Author_Institution :
Fac. of Eng., Multimedia Univ., Cyberjaya, Malaysia
Abstract :
In this work, the pulse electrodeposition technique has been successfully employed for the deposition of CdSe nano-films on gold coated glass substrates. The films were deposited at a constant current density of 200 mA/cm2 for a period of 10 min with duty cycles varies from 50% to 6.25%, at a bath temperature of 100°C. X-ray diffraction studies indicated hexagonal structure with peaks assigned with the earlier report. The crystallite size of the CdSe nanoparticles was estimated from the X-ray diffraction pattern by using Scherrer´s formula. Optical absorption studies indicated a direct band gap value in the range 1.70 eV-1.99 eV as the duty cycle was varied from 50% to 6.25%. The transmission electron diffraction pattern obtained on CdSe nanocrystals on (111) gold surface. At a still shorter duty cycle, for 6.25% duty cycle, the size of the particle is further reduced and nearly isolated nanocrystals are obtained.
Keywords :
II-VI semiconductors; X-ray diffraction; absorption coefficients; cadmium compounds; current density; electrodeposition; electron diffraction; energy gap; nanoparticles; nanotechnology; particle size; semiconductor growth; semiconductor thin films; ultraviolet spectra; 10 min; 100 degC; CdSe; CdSe nanoparticles; Scherrer´s formula; X-ray diffraction; band gap; crystallite size; current density; gold coated glass substrates; gold surface; nanocrystals; optical absorption; optical properties; particle size; pulse electrodeposition; pulse plated CdSe nano films; structural properties; transmission electron diffraction; Current density; Glass; Gold; Nanocrystals; Optical diffraction; Optical films; Optical pulses; Pulsed laser deposition; Temperature; X-ray diffraction;
Conference_Titel :
Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on
Print_ISBN :
0-7803-7578-5
DOI :
10.1109/SMELEC.2002.1217783