Title :
Advanced IC technologies I
Author :
Loke, Alvin ; Sunderland, David
Author_Institution :
Advanced Micro Devices
Abstract :
This all-Invited session covers advanced technologies, including the first production tri-gate devices, ultra-thin SOI, reliability challenges for scaled CMOS, and SiC devices for power management.
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA, USA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330656
