DocumentCode
1806439
Title
Sensitive measurement of surface resistance of conductive films using dielectric resonator
Author
Sun, Xuewen
Author_Institution
Nat. Key Lab. of Electron. Meas. Technol., CETC, Qingdao
Volume
2
fYear
2008
fDate
21-24 April 2008
Firstpage
624
Lastpage
626
Abstract
Two measurement systems for microwave surface impedance of conductive thin films were presented The advantage and disadvantage of the measurement systems were discussed. The structure of measurement was first designed.
Keywords
dielectric resonators; electric resistance measurement; microwave measurement; surface resistance; thin films; conductive thin films; dielectric resonator; microwave surface impedance; sensitive measurement; surface resistance; Conductive films; Conductivity measurement; Dielectric films; Dielectric measurements; Dielectric thin films; Electrical resistance measurement; Impedance measurement; Microwave measurements; Surface impedance; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location
Nanjing
Print_ISBN
978-1-4244-1879-4
Electronic_ISBN
978-1-4244-1880-0
Type
conf
DOI
10.1109/ICMMT.2008.4540471
Filename
4540471
Link To Document