DocumentCode :
1806578
Title :
Multiple transit regions Gunn diodes
Author :
Teoh, Y.P. ; Dunn, G.M. ; Priestley, N. ; Carr, M.
Author_Institution :
Dept. of Eng., Univ. of Aberdeen, UK
fYear :
2002
fDate :
19-21 Dec. 2002
Firstpage :
160
Lastpage :
162
Abstract :
Conventional Gunn diodes consist of a single transit region. For high frequency generation, these devices are quite short and hence yield limited power because of the small potential that can be applied before the device breaks down. In this paper, we present Monte Carlo simulations of multiple (up to eight) transit regions Gunn Diodes and investigate their feasibility and power performance. We found that coherent transfer of domains occurs in all the devices we investigated and there seems to be no obvious upper limit to the number of transit regions that could be incorporated into a single device (in the absence of thermal limitations). Our models predict that the power attainable from the Gunn diodes increases linearly with the square of the number of transit regions.
Keywords :
Gunn diodes; Monte Carlo methods; power semiconductor diodes; semiconductor device breakdown; semiconductor device models; Monte Carlo simulations; coherent transfer; device breaks down; domains; high frequency generation; multiple transit regions Gunn diodes; Diodes; Doping profiles; Frequency; Gallium arsenide; Gunn devices; MMICs; Power engineering and energy; Power generation; Power system modeling; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on
Print_ISBN :
0-7803-7578-5
Type :
conf
DOI :
10.1109/SMELEC.2002.1217796
Filename :
1217796
Link To Document :
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